[Chronicle]

February 3, 2005
Vol. 24 No. 9

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    Accolades


    For the first time in its 30-year history, the Smart Museum of Art has been honored by the International Association of Art Critics, United States.

    The AICA awarded the second place award for Best Thematic Museum Show Presented in New York City to the Smart Museum and the International Center for Photography in New York for their joint exhibition, “Between Past and Future: New Photography and Video from China.”

    Each year the United States section of the AICA invites its nearly 400 members to vote for the best exhibitions created during that season.

    It is the only award to formally recognize excellence in this area.

    The exhibition, which was on display until Sunday, Jan. 16, was co-curated by Wu Hung, the Harrie H. Vanderstappen Distinguished Service Professor in Art History and East Asian Languages & Civilizations, and Christopher Phillips of the International Center for Photography.